What is ISO 21222 about?
ISO 21222 is an international standard that discusses surface chemical analysis for scanning probe microscopy.
ISO 21222 describes a procedure for the determination of elastic modulus for complaint materials using an atomic force microscope (AFM). Under ISO 21222 force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory.
ISO 21222 applies to complaint materials having elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contract radius between the AFM probe and the surface and is typically approximately 10-20nm.
Who is ISO 21222 for?
ISO 21222 on scanning probe microscopy for surface chemical analysis is useful for:
- Manufacturing of microscope
- Companies dealing with atomic force microscope and two-point JKR method
- Retailers and suppliers for microscope
Why should you use ISO 21222?
An atomic force microscope (AFM) is a member of the scanning probe microscope (SPM) family and is used to image surfaces by mechanically scanning a probe over the surface.
ISO 21222 gives you a procedure for the determination of the elastic moduli for compliant materials using AFM. Force-distance curves are obtained on the surfaces of compliant materials which are used for the calculation of elastic modulus which is based on the Johnson-Kendall-Roberts (JKR) two-point method.
ISO 21222 is an atomic force microscope (AFM) that provides other data like topographic, mechanical and chemical specifications about a surface depending on the operation and the property of the probe tip, which makes operating and scanning probe microscopy easier.