1 Scope
This part of IEC 62047 specifies the test method of electrical characteristics under bending deformation
for flexible electromechanical devices. These devices include passive micro components
and/or active micro components on the flexible film or embedded in the flexible film.
The desired in-plane dimensions of the device for the test method ranges typically
from 1 mm to 300 mm and the thickness ranges from 10 μm to 1 mm, but these are not
limiting values. The test method is so designed as to bend devices in a quasi-static
manner monotonically up to the maximum possible curvature, i.e. until the device is
completely folded, so that the entire degradation behaviour of the electric property
under bending deformation is obtained. This document is essential to estimate the
safety margin under a certain bending deformation and indispensable for reliable design
of the product employing these devices.