Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials

Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials

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1   Scope

This part of IEC 62047 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 μm.