Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

£142.00
£142.00
£71.00
Sold out

1   Scope

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.