Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
  • Load image into Gallery viewer, Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
  • Load image into Gallery viewer, Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test

£166.00
£166.00
£83.00
Sold out

1   Scope

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.