Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices

Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices

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1   Scope

This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.