What is BS EN IEC 60749‑41 about?
BS EN IEC 60749‑41 is the 41st part of Semiconductor devices in multi-series
BS EN IEC 60749‑41 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Who is BS EN IEC 60749‑41 for?
BS EN IEC 60749‑41 on Semiconductor devices is useful for:
- Semiconductor foundries
- Manufacturer of electronic devices
- Manufacturer of automobile
Why should you use BS EN IEC 60749‑41?
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function.
BS EN IEC 60749‑41 helps in understanding the retention durations and temperature for both cycled and uncycled devices. These qualification specifications stated in BS EN IEC 60749‑41 helps in undergoing endurance cycle followed by retention stressing.
BS EN IEC 60749‑41 helps in detecting the failures such as transient failure and device failure and also helps in calculating the UBER.
Overall, BS EN IEC 60749‑41 will help you in completing the endurance and retention stresses through electrical measurements. This endurance test helps to detect the failures when the data written after every cycle is verified.