What is BS EN 60749-38 – Soft error test for semiconductor devices?
BS EN 60749-38 is an international standard that focuses on soft error test methods for semiconductor devices.
BS EN 60749-38 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device.
BS EN 60749-38 stipulates the technicalities such as related terms and definitions, test apparatus, test sample, test procedures, evaluation, etc., for the soft error test method for semiconductor devices with memory.
Who is BS EN 60749-38 - Soft error test for semiconductor devices?
BS EN 60749-38 on soft error test for semiconductor devices is useful for:
- Semiconductor device manufacturers
- Manufacturer of electronic devices
- Manufacturers and suppliers of semiconductor devices
- Product design engineers
- Quality assurance authority
- Regulatory authorities
Why should you use BS EN 60749-38 - Soft error test for semiconductor devices?
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function. A soft error is an erroneous output signal from a latch or memory cell that can be corrected by performing one or more normal functions of the device containing the latch or memory cell.
BS EN 60749-38 provides you with the test methods for evaluating the soft error susceptibility of a semiconductor device, which helps you to avoid any mechanical damage such as cracking, chipping, or breaking that leads to overall product/application failure.
BS EN 60749-38 gives you detailed information about the apparatus needed to perform the test, explains the principle of the test, helps the users with the evaluations as well as concludes the final test summary. It also helps you identify the failures if the parametric limits are exceeded or if functionality cannot be demonstrated under nominal and worst-case conditions.
Overall, BS EN 60749-38 proves very helpful to the users to evaluate the efficiency and the reliability of the semiconductor devices with memory, by evaluating its soft error sensitivity.