Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere

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1   Scope

This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.