What is BS EN IEC 60749-13 – Salt atmosphere test for semiconductor devices about?
BS EN IEC 60749 is an international standard on semiconductor devices.
BS EN IEC 60749-13 is the 13th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces.
BS EN IEC 60749-13 is only applicable to those devices specified for a marine environment.
Who is BS EN IEC 60749-13 - Salt atmosphere test for semiconductor devices for?
BS EN IEC 60749-13 on salt atmosphere test is relevant to:
- Semiconductor device manufacturers
- Manufacturer of electronic devices
- Product design engineers
- Automobile industry
- Marine industry
- Electrical engineers
- Fabricators
Why should you use BS EN IEC 60749-13-Salt atmosphere test for semiconductor devices?
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function.
BS EN IEC 60749-13 provides guidance on how to address failure criteria such as pinholes, pitting, blistering, flaking, corrosion product that fully crosses the lead, or any indication of pinholes, pitting, blistering, flaking, corrosion product, or corrosion stain at the glass seal.
As a consequence, it makes it easier to settle fog and prevents corrosion products and condensate from one specimen from falling onto another. You can thus avoid pressure build-up and ensure that salt fog is distributed evenly.
What’s changed since the last update?
BS EN IEC 60749-13:2018 supersedes BS EN 60749-13:2002, which is withdrawn. BS EN IEC 60749-13:2018 includes the following technical change with respect to BS EN 60749-13:2002:
- Alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures)