Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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What is BS EN IEC 6074920 about?  

BS EN IEC 6074920 is the 20th part of semiconductor the multi-series European standard on semiconductor devices.  

BS EN IEC 6074920 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. 

Who is BS EN IEC 6074920 for? 

BS EN IEC 6074920 on Semiconductor devices is useful for: 

  • Semiconductor foundries 
  • Manufacturer of electronic devices 
  • Manufacturer of automobile 

Why should you use BS EN IEC 6074920?  

Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function.  

Package cracking and electric failure take place when the soldering heat is increased, and the moisture has been absorbed into surface mounted devices during storage. These problems are solved with the help of BS EN IEC 6074920, as these surface mounted devices (SMDs) are evaluated to heat resistance after being soaked in an environment. 

BS EN IEC 6074920 helps in moisturizing surface mount devices (SMDs) before and after opening the dry-packed SMDs.  

BS EN IEC 6074920 will help you in resisting the soldering heat of Semiconductor devices which are packed as plastic encapsulated surface mount devices (SMDs).  

Overall, BS EN IEC 6074920 is a comprehensive guide to the protection and assurance of quality and safety of products and equipment encapsulated in plastic from moisture and soldering heat. 

What’s changed since the last update?  

BS EN IEC 6074920:2020 supersedes BS EN 6074920:2009. BS EN IEC 6074920:2020 includes some technical changes concerning BS EN 6074920:2009: 

  • Incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition) 
  • Inclusion of new Clause 3 
  • Inclusion of explanatory notes