1 Scope
This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for
use in electronic equipment which may be subjected to moderately severe shocks as
a result of suddenly applied forces or abrupt changes in motion produced by rough
handling, transportation, or field operation. Shock of this type may disturb operating
characteristics, particularly if the shock pulses are repetitive. This is a destructive
test. It is normally applicable to cavity-type packages.
In general, this mechanical shock test is in conformity with IEC 60068‑2‑27 but, due to specific requirements of semiconductors, the clauses of this standard
apply.