What is BS EN 60749-31 – Plastic encapsulated devices about?
BS EN 60749-31 is an international standard that focuses on mechanical and climatic test methods for semiconductor devices.
BS EN 60749-31 establishes mechanical and climatic test methods for semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device.
Note: BS EN 60749-31 is identical to the test method contained in 1.1 of chapter 4 of IEC 60749 (1996), apart from changes to this clause, the addition of titles to clauses 2 and 3 and renumbering.
Who is BS EN 60749-31 - Plastic encapsulated devices for?
BS EN 60749-31 on plastic encapsulated device is useful for:
- Semiconductor device manufacturers
- Manufacturer of electronic devices
- Manufacturers and suppliers of semiconductor devices
- Product design engineers
- Quality assurance authority
- Regulatory authorities
Why should you use BS EN 60749-31 - Plastic encapsulated devices?
Plastic Encapsulated Microcircuits (PEMs) are gaining acceptance over traditional ceramic parts in avionics, telecommunications, military, and space applications due to advantages in size, weight, cost, availability, performance, and state-of-the-art technology and design.
For space applications, economic considerations encourage the use of plastic parts to both reduce cost and shorten design cycle times. However, to the well-informed user, the risk of using PEMs in any high-reliability application is considered high for reasons that have been discussed in BS EN 60749-31.
BS EN 60749-31 gives you the generation, coordination, and review of climatic, electrical, mechanical test methods, and associated inspection techniques for plastic encapsulated devices. This helps the users to assess the quality and reliability of the design and manufacture of semiconductor products and processes.
Thus, BS EN 60749-31 proves beneficial for its users as it helps them improve or maintain the high quality and secure functioning semiconductor devices.