What is BS EN 60749-36 – Acceleration tests of semiconductor devices about?
BS EN 60749-36 is an international standard that focuses on mechanical and climatic tests of semiconductors devices.
BS EN 60749-36 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration tests.
Who is BS EN 60749-36 – Acceleration tests on semiconductor devices for?
BS EN 60749-36 on acceleration test of semiconductor devices is useful for:
- Semiconductor device manufacturers
- Manufacturer of electronic devices
- Manufacturers and suppliers of semiconductor devices
- Product design engineers
- Quality assurance authority
- Regulatory authorities
Why should you use BS EN 60749-36 – Acceleration tests on semiconductor devices?
The acceleration tests may be used as high stress (destructive) tests to determine the mechanical limits of the package, internal metallization, lead system, die or substrate attachment, and other
elements of the microelectronic device.
BS EN 60749-36 gives you the test procedure for acceleration tests on semiconductor devices. It could be employed as a non-destructive in-line 100 % screen to detect and eliminate devices with lower-than-normal mechanical strengths in any of the structural elements when proper stress levels have been established.
Thus, BS EN 60749-36 proves beneficial for its users as it helps them improve or maintain the high quality and secure functioning semiconductor devices.