Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary - Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary - Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary - Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices

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What is PD IEC TS 61994‑4‑4  - Single crystal wafers about?  

PD IEC TS 61994‑4‑4 is the fourth part of an international standard used for piezoelectric, dielectric, and electrostatic devices.  

PD IEC TS 61994‑4‑4 specifies the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. 

Who is PD IEC TS 61994‑4‑4 - Single crystal wafers for? 

PD IEC TS 61994‑4‑4 on piezoelectric, dielectric, and electrostatic devices is useful for: 

  • Manufacturers of electronic devices   
  • Manufacturers of piezoelectric, dielectric, and electrostatic devices 
  • Manufacturers of automotive parts 
  • Electronic engineers  
  • Semiconductor foundries 

Why should you use PD IEC TS 61994‑4‑4 - Single crystal wafers?  

Single crystal wafers are used as substrate material due to their mechanical stability. These Single crystal wafers are useful in combining the sensing elements and electronics on the same substrate. Using PD IEC TS 61994‑4‑4 you can combine the elements by using s ingle crystal wafers in surface acoustic wave (SAW) devices.  

PD IEC TS 61994‑4‑4 specifies the terms and definitions of all the crystals along with the LN and LT crystals. These terms are useful in identifying and choosing the materials that are to be used in producing the devices. The designs specified in PD IEC TS 61994‑4‑4 are useful in measuring the characteristics of Single-crystal wafers. With the help of PD IEC TS 61994‑4‑4, you can detect the defects or failures present in the devices. Using PD IEC TS 61994‑4‑4 you will be able to understand the terms that are used in the manufacturing process of surface acoustic wave (SAW) devices.   

What’s changed since the last update?  

PD IEC TS 61994‑4‑4:2018 supersedes DD IEC/TS 61994‑4‑4:2010. PD IEC TS 61994‑4‑4:2018 includes some technical changes with respect to DD IEC/TS 61994‑4‑4:2010. These include: 

  • The new terms and definitions given in IEC 62276:2016 have been taken into account 
  • The general title has been changed according to the change in the title of TC 49 in 2009 
  • The part title has been changed according to the title of IEC 62276:2016