What is PD IEC/TS 62916-Bypass diode electrostatic discharge test about?
PD IEC/TS 62916 describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function.
PD IEC/TS 62916 does not purport to address the causes of electrostatic discharge or to establish pass or fail levels for bypass diode devices. It is the responsibility of the user to assess the ESD exposure level for their particular circumstances.
PD IEC/TS 62916 does not apply to large energy surge events such as direct or indirect lightning exposure, utility capacitor bank switching events, or the like.
Who is PD IEC/TS 62916-Bypass diode electrostatic discharge test for?
PD IEC/TS 62916 on the photovoltaic module is useful to:
- PV module manufacturers
- PV power system manufacturers
- Photoelectric device manufacturers
- Solar energy engineering industry
- Product designers
- Quality assurance and testing personnel
Why should you use PD IEC/TS 62916-Bypass diode electrostatic discharge test?
Bypass diodes inserted across the strings of the solar panel arrays are essential to ensure the efficiency of the solar power system.
The purpose of PD IEC/TS 62916 is to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an electrostatic discharge event during the manufacturing, packaging, transportation, or installation processes of PV modules.
The data generated by this procedure in PD IEC/TS 62916 can help you in the qualification of new design types, quality control for incoming material, and/or identify the need for additional electrostatic discharge controls in the manufacturing process.