Nanotechnology. Reliability assessment - Nano-enabled photovoltaic devices. Stability test

Nanotechnology. Reliability assessment - Nano-enabled photovoltaic devices. Stability test

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1   Scope

This part of IEC 62876, which is a Technical Specification, establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

NOTE 1 The tests in this document are selected with outdoor use in mind, and as such represent isolated stress factors that devices will be exposed to in outdoor environments. For indoor environments, the stresses faced by the devices in operation are significantly less severe, and not all tests will be applicable. Despite this, the suggested tests provide a means of tracking stability improvements and can provide valuable data during device development.

NOTE 2 The performance of devices will be evaluated before and after the application of the stress tests. The efficiency characterization methods for NePV have not been fully established at present. In the text, notes are therefore added regarding the efficiency characterization. The notes particularly address issues to be discussed in the future for applications such as indoor use, or devices with a slow response or uncommon spectral responses such as tandem cells.

NOTE 3 The scope does not include photovoltaic modules, i.e. the final product. It is only intended to test the technology.