What is PD IEC/TS 62607-6-4 – Graphene Surface conductance measurement?
PD IEC/TS 62607-6-4 is an international standard that focuses on surface conductance measurement using a resonant cavity with graphene and key control characteristic. PD IEC/TS 62607-6-4 establishes a method for determining the surface conductance of twodimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite.
Who is PD IEC/TS 62607-6-4 - Graphene Surface conductance measurement for?
PD IEC/TS 62607-6-4 on graphene surface conductance measurement using a resonant cavity is useful for:
- Battery manufacturing companies
- Nanomanufacturing companies
- Testing laboratories
- Engineers and designers of nano-enabled electrical energy storage
- Manufacturing unit of two-dimensional nano-carbon materials
Why should you use PD IEC/TS 62607-6-4 - Graphene Surface conductance measurement?
The microwave resonant cavity test method for surface conductance is non-contact, fast, sensitive, and accurate.
PD IEC/TS 62607-6-4 is well suited for standards, research, and development (R&D), and for quality control in the manufacturing of two-dimensional (2D) nano-carbon materials.
PD IEC/TS 62607-6-4 informs you of the density of states and structural perfection and the surface conductance of these materials.