What is ISO 13067 about?
ISO 13067 is an international standard that discusses microbeam analysis for electron backscatter diffraction. ISO 13067 specifies the procedures for measuring average grain size derived from a two- dimensional polished cross-section using backscatter diffraction (EBSD).
ISO 13067 requires the measurement of orientation, disorientation and pattern quality factor as a function of position in the crystalline specimen.
Who is ISO 13067 for?
ISO 13067 on electron backscatter diffraction is useful for:
- Manufacturing of microscope
- Companies dealing with microscopes for microbeam analysis
- Retailers and suppliers of microscope
Why should you use ISO 13067?
The mechanical and electromagnetic properties of engineering materials are strongly influenced by their crystal grain size and distribution.
Electron backscatter diffraction is a scanning electron microscope that is based on the microstructural-crystallographic characterization technique which is commonly used for studying crystalline or polycrystalline materials. ISO 13067 provides you with the procedures for measuring average grain size from maps of local orientation measurements using the electron backscatter diffraction for analyzing Microbeam.
ISO 13067 provides you with various terms for the measurement of average grain size using electron backscatter diffraction like orientation, indexing reliability, orientation map, pseudosymmetry, fore scatter imaging, electron channelling contrast imaging, etc. which ensure to find the measurement of average grain size.
What’s changed since the last update?
BS ISO 13067:2020 supersedes BS ISO 13067:2011, which is withdrawn. The main changes with respect to the previous edition are:
Data from a round-robin (Annex B) has been used to
- Include information on expected precision and more detail on sources of errors
- Clarify statements on minimum numbers of grains measured (5.8) and acceptable cleanup procedures (6.3–6.3)
- Clarify the distinction between sectional grain size measured on a 2D section and average grain size determined from some 2D measurements of grain sections
- Additionally, improvements in the calculation of average values (6.5) and representation of the data (6.6)