What is BS EN IEC 61967‑1 about?
BS EN IEC 61967‑1 is the first part of the international multi-series standard that focuses on integrated circuits.
BS EN IEC 61967‑1 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits.
BS EN IEC 61967‑1 also provides a description of measurement conditions, test equipment, and set-up as well as the test procedures and content of the test reports. Test method comparison tables are included to assist in selecting the appropriate measurement methods.
Who is BS EN IEC 61967‑1 for?
BS EN IEC 61967‑1 on Integrated circuits is applicable to:
- Manufacturers and suppliers of electronic devices
- Manufacturers of automotive parts
- Testing laboratories for integrated circuits
- Electronics and electrical engineers
Why should you use BS EN IEC 61967‑1?
A determination of whether the emissions are predominately narrowband, or broadband can be made by measuring at the default bandwidth and at the next narrower (one-third) increment of bandwidth.
The object of BS EN IEC 61967‑1 is to describe general conditions in order to help the users to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described.
BS EN IEC 61967‑1 specifies test conditions that enable you to ensure a consistent test environment which helps in identifying the test equipment according to their operational requirements.
What’s changed since the last update?
BS EN IEC 61967‑1:2019 supersedes BS EN 61967‑1:2002, which is withdrawn. BS EN IEC 61967‑1:2019 includes some technical changes with respect to the previous edition as:
- The frequency range of 150 kHz to 1 GHz has been deleted from the title
- The frequency step above 1 GHz has been added to Table 1, Table 2, and to 5.4
- Table A.1 has been divided into two tables, and IEC 61967-8 has been added to Table A.2 of Annex A
- The general test board description has been moved to Annex D