Fibre optic interconnecting devices and passive components. Basic test and measurement procedures - Examinations and measurements. Polarization dependent loss in a single-mode fibre optic device

Fibre optic interconnecting devices and passive components. Basic test and measurement procedures - Examinations and measurements. Polarization dependent loss in a single-mode fibre optic device

Regular price
£166.00
Sale price
£166.00
Regular price
£83.00
Sold out
Unit price
per 

BS EN 61300-3-2:2009 Fibre optic interconnecting devices and passive components. Basic test and measurement procedures. Examinations and measurements. Polarization dependent loss in a single-mode fibre optic device

BS EN 61300-3-2 specifies measurement methods to determine the dependence of loss in a single-mode fibre optic device to changes in polarization. This procedure focuses on measurements with a fixed wavelength source. This procedure is applicable to devices whose properties at a single wavelength can represent those over the broader wavelength band. Typical examples of such devices are single-mode interconnecting devices and passive components, including connectors, splices, branching devices, attenuators, isolators, and switches. The maximum observed variation in transmission loss is referred to as polarization-dependent-loss (PDL).

BS EN 61300-3-2 applies to broadband devices and not to narrow-band devices like filters and multiplexers. Refer to IEC 61300-3-29 for such measurements.

Contents of BS EN 61300-3-2:

  • Scope and object
  • Normative references
  • Measurement methods
  • All states method
  • Mueller matrix method
  • Apparatus
  • Optical source (S)
  • Temporary joint (TJ)
  • Polarization state change system (PSCS
  • All states method
  • Mueller matrix method
  • Reference branching device (RBD) (optional)
  • Detectors (D
  • Data read-out / recording / processing devices
  • Procedure
  • Preparation of specimens
  • Pre-conditioning
  • Initial measurements
  • Test precautions
  • Reference measurement
  • Device measurement
  • Data analysis
  • All states method
  • Mueller matrix method
  • Details to be specified
  • Measurement uncertainties
  • Polarization mapping of deterministic and pseudo-random techniques
  • Measurement apparatus
  • Examples of PSCS for the all states method (deterministic and random)
  • Polarization state change system
  • Reference measurement apparatus
  • All states apparatus uncertainty
  • Alternate apparatus for Mueller Matrix