What is BS IEC 60747-14-2 - Semiconductor Hall element sensors about?
BS IEC 60747-14-2 is the 14th part of a multi-series standard used for Semiconductor devices that specifies the measuring methods for semiconductor Hall element sensors. This helps in manufacturing good quality semiconductor hall elements used in semiconductor sensors.
BS IEC 60747-14-2 provides standards for packaged semiconductor Hall elements which utilize the Hall effect.
Who is BS IEC 60747-14-2 - Semiconductor Hall element sensors for?
BS IEC 60747-14-2 on Semiconductor Hall element sensors is useful for:
- Manufacturers of semiconductor devices
- Manufacturers of electronic devices
- Manufacturers of automotive parts
- Electronic engineers
- Semiconductor foundries
Why should you use BS IEC 60747-14-2 - Semiconductor Hall element sensors?
A semiconductor device is an electronic component that contains the electronic properties of semiconductor material.
BS IEC 60747-14-2 specifies the measuring methods for semiconductor Hall element sensors. The measuring methods are as follows:
- Useful in measuring output hall voltage and offset voltage
- Determines the input and output resistance
- Calculates temperature coefficient of output hall voltage and input resistance
BS IEC 60747-14-2 helps in determining the limiting values and characteristics of these semiconductor sensors. The dimensions specified are useful in designing and constructing these packaged semiconductor hall elements used in semiconductor sensors. By applying BS IEC 60747-14-2, you can standardize the manufacturing process which helps in designing and producing good quality semiconductor hall element sensors.