1 Scope
This part of IEC 62878 describes the test element group devices useful when measuring basic properties of
device embedded substrates.
This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material,
which include for example active or passive devices, discrete components formed in
the fabrication process of electronic wiring board, and sheet formed components.
The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules
defined as an M-type business model in IEC 62421.