What is ISO 23216 about?
ISO 23216 specifies spectroscopic ellipsometry for the determination of optical properties (refractive index n and extinction coefficient k) and the optical classification of different types of amorphous carbon films within the n-k plane.
ISO 23216 is applicable to amorphous carbon films deposited by ionized evaporation, sputtering, arc deposition, plasma-assisted chemical vapour deposition, hot filament techniques and others.
Note: ISO 23216 apply to carbon films modified with metals or silicon, amorphous carbon films that have a gradient of composition/property in the thickness, paints, and varnishes.
Who is ISO 23216 for?
ISO 23216 on amorphous carbon films is applicable to:
- Automotive parts manufacturer
- Biomedical and optical devices manufacturer
In the computers, electronic and solar energy sectors such as
- Photovoltaic devices
- Phin-film solar cells
- Flexible touch-screen panels
- Micro-batteries
- Electrochemical micro-capacitors
- Humidity sensors
- Optoelectronic devices
Why should you use ISO 23216?
ISO 23216 provides guidelines to determine the optical properties of amorphous carbon films
which are employed in a variety of hard coating applications on hard metals due to their superior mechanical qualities, such as protective coatings against wear and corrosion in automobile parts.
ISO 23216 aimed to standardise ellipsometric test conditions and the n-k plane categorization method for amorphous carbon films on silicon wafers.
Because amorphous carbon films have such a wide range of structures and properties, it is crucial to choose the right type of amorphous carbon film to take advantage of its exceptional properties in practical applications hence ISO 23216 is useful for amorphous carbon film optical property classification and quality control.
Currently, amorphous carbon films are classified into several types with regard to their chemical structures, and each type is selectively used according to its appropriate application. For an easy classification of amorphous carbon films, an optically quantifiable phase fingerprint with high accuracy is provided as a result of an international interlaboratory comparison. This will be beneficial for the identification of the coating type on alternative substrate materials and additional industrial applications.
The method of spectroscopic ellipsometry provided in ISO 23216 is a fast and non-destructive analytical method which can be applied to quality control and development in industrial applications, given that smooth and well-defined substrate materials is used and appropriate modelling is applied.