What is BS 7020-5.2 - Reduced molybdosilicate spectrophotometric method for the determination of the silicon content of iron ores about?
BS 7020-5.2 specifies a reduced molybdosilicate spectrophotometric method for the determination of the silicon content of iron ores.
This method is applicable to silicon contents between 0,1 % (m/m) and 5,0 % (m/m) in natural iron ores, iron ore concentrates and agglomerates, including sinter products, especially for ores containing fluorine.
The fluorine content of the sample does not affect the determination.
Who is BS 7020-5.2 - Reduced molybdosilicate spectrophotometric method for the determination of the silicon content of iron ores for?
BS 7020-5.2 on reduced molybdosilicate spectrophotometric method for the determination of the silicon content of iron ores is useful for:
- The mining industry
- The iron and steel industry
- Suppliers of and distributors of raw iron ore
- Manufacturers of iron and steel products
- Product development/innovation teams
- Research and testing personnel
- Quality control personnel
- Relevant compliance authorities
Why should you use BS 7020-5.2 - Reduced molybdosilicate spectrophotometric method for the determination of the silicon content of iron ores?
Iron ore is primarily used in the production of iron. This iron produced is then used to make steel. Steel has multiple applications such as in automobiles, locomotives, ships, beams used in buildings, furniture, etc.
BS 7020-5.2 provides you guidance on carrying out reduced molybdosilicate spectrophotometric method, which could be used for the determination of the silicon content of iron ores in a variety of samples.
BS 7020-5.2 helps you with guidance on correct sample preparation, procedure for a number of determinations, blank test and check test, also provides a flowsheet of the procedure for the acceptance of analytical values for test samples.
Compliance with BS 7020-5.2 enables manufacturers and suppliers of iron ores to achieve the required quality of the product by analyzing the ore in detail for traces of other elements like silicon.